AFM Lunch & Learn
University of Arizona
October 24, 2019
Atomic Force Microscopes (AFMs) uncover surface properties ranging from shape and texture to local stiffness and conductivity in various research fields including semiconductors, data storage, 2D materials and polymers, to name a few.
Oxford Instruments Asylum Research will present an overview of a completely new large-sample AFM that offers superior resolution, higher speed, ease-of-use and flexibility—the Jupiter XR AFM.
This is an excellent opportunity for students, researchers and team leaders to learn about how AFM could impact their projects or just to get a glimpse of the advances in AFM technology.
Registration is free, but all attendees must register due to limited seating.