23rd - 24th April 2020
Join us at the 13th Annual FIB SEM Meeting at the John Hopkins Applied Physics Laboratory, Laurel, MD, USA. Expect discussions highlighting recent advances in technology and applications for FIB. This years meeting will be hosted by the University of Sheffield, UK, abd will feature contributions in the fields of geoscience, materials science, engineering and mechanical engineering.
Meet with Oxford Instruments NanoAnalysis, providers of leading-edge tools for enabling materials characterisation and sample manipulation, to discuss your research.
For more information go to: 13th Annual FIB SEM Meeting
Laurel MD, USA