Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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X-Strata980 for analysis of trace elements and coating thickness

X-Strata980 for analysis of trace elements and coating thickness

X-Strata980 for analysis of trace elements and coating thickness

Combining a high power X-ray tube and high resolution detector, the X-Strata980 X-ray Fluorescence analyzer delivers limits of detection in single digit ppms!

  • 100W X-ray tube and 25mm2 Peltier cooled PIN detector
  • Multiple collimators
  • Simultaneous analysis of thickness and composition
  • Mapping software
  • Combined calibration  method
  • Color-coded pass/fail results
  • Giant chamber


Key Applications

  • Trace analysis of hazardous substances
  • Solder alloy analysis
  • Coating thickness measurement of gold and palladium on electronics
  • Metal alloy chemistry identification
  • Coating thickness measurement on jewelry

Oxford Instruments offers a full range of instruments dedicated to the electronics manufacturing industry. Our XRF instruments are available in different configurations for RoHS compliance screening and testing. When testing for the presence of lead, as with high-reliablity electronics, the X-Strata980 can assure quality.  Please contact us to find out about the wide variety of solutions offered.

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