The all new 30mm² Si(Li) detector INCAPentaFET-x3

INCAPentaFET-x3 : 30mm² EDS Mircoanalysis Detector

The INCAPentaFET-x3 is a powerful new Si(Li) detector, which has a 30mm² detecting crystal, with the same resolution as a traditional 10mm². Using INCAPentaFET-x3 you can achieve decreased time to results or better quality results in the same analysis time, with no compromise in resolution or analytical performance.

Standard Features

• Works on the widest range of applications from low energy and low counts to increased productivity and high counts.
• Collects up to x3 more data for the same beam current when compared to 10mm² Si(Li) or drift detector
• Or collects the same data in a 1/3 of the time
• Or collects the same data for a 1/3 of the beam current when compared to 10mm² Si(Li) or drift detector
• The ability to work at low beam currents reduces sample damage and contamination
• Excellent low energy performance for the lifetime of the detector
• Guaranteed resolution on your microscope and at a more realistic count rate of 4,000cps 
• Guaranteed <1eV shift in peak position and resolution between count rates of 1Kcps and 10Kcps
• Especially suited to FEGSEM
• Detection of elements down to Be
• Performance promises are guaranteed and tested on installation in line with ISO15632:2002
• Patented conditioning circuit, that removes crystal contamination ensuring optimum performance at all times
• All new Si(Li) detector combined with the uniquely stable INCAx-stream pulse processor to ensure you get the same results at 10,000cps as you do at 1,000cps