Oxford Instruments specialises in the design, manufacture and support of innovative solutions, tools and systems for the emerging nanotechnology markets in areas such as XRF (X-ray Fluorescence) analysers , microanalysis systems, superconducting wires, NMR (nuclear magnetic resonance) magnets, cryogenic systems, plasma etch and deposition low temperature environments and coating thickness measurement.

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INCAEnergyTEM – EDS Microanalysis system for Analytical Transmission Electron Microscopy

INCAEnergy TEM : EDS system for Analytical Transmission Electron Microscopy

INCAEnergy TEM : EDS system for Analytical Transmission Electron Microscopy

INCAEnergyTEM has been designed to accommodate the needs of TEM/STEM analysis. Detector specifications are well suited to modern Analytical TEMs with detector protection for 100kV intermediate and high voltage microscopes and almost instant recovery times when exposed to high electron flux. Software has been developed specifically to address the needs of the TEM analyst taking into account the special conditions needed for thin specimens.

IETEM is the obvious choice for quantitative and qualitative EDS analysis on your TEM.

NEW - 50mm2 Transmission Electron Microscope Detector offering users increased solid angle and count rate for EDS »

 

  • Reliable hardware that comes with a guaranteed performance <1ev shift in peak position and resolution between count rates of 1Kcps and 10Kcps.
  • Reliable detector that comes with guaranteed performance - resolution guaranteed on the microscope.
  • Patented conditioning circuit, that removes crystal contamination ensuring optimum performance all the time
  • Shutter for protecting against electron flux. Does not require any detector retraction which can affect high resolution imaging.
  • Optimized solid angle for best count rates.
  • Quantitation specific to TEM analysis. Cliff-Lorimer routine with the ability to input thickness and density parameters for absorption corrections.
  • Data presentation as quantitative results, charts, line profiles etc.
  • Automatic spectrum termination on a window integral for optimum detection of trace elements
  • Spectrum reconstruction

Additional Features

Smartmap and quantmap

Sitelock beam drift collection

Point and ID

Lines and Grids

Phasemap

Spectrum matching

Cameo+

Recommended configuration:

EnergyTEM 250 system including:-

Smartmap

Sitelock

Point and ID

Lines and Grids

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