The highly successful
X-Max 80 detector is now available for use on Transmission Electron Microscopes! This detector has solid angles significantly greater than any commercially available SDD for TEM. X-rays are collected faster due to greater collection efficiency, and the count handling capability of SDD. See the difference immediately when analysing nanoparticles, or collecting linescans or X-ray maps. The
X-Max TEM will increase productivity without sacrificing accuracy - all in a liquid nitrogen free environment.
X-Max TEM offers all the advantages of large area SDD detectors 
Detector Technology
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80mm2 very large area sensor with excellent performance at high count rates offers unparalleled speed of data collection
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Higher spectral resolution even at high count rates allows for the detection of elements as low as Be
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Accepts higher count rates without flooding the detector (e.g. crossing grid bars or thick metallurgical samples)
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Peltier cooling for fast cool down times and safety
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Automatic retraction behind flap to protect against high electron flux
Large solid angle
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Decrease in analysis time for point acquisition, linescans and maps
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Handle higher count rates without the loss of accuracy to achieve better results in shorter count times
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Analysis of nanoparticles made easier due to increased collection efficiency
Liquid Nitrogen Free
- Safer working environment with no need to fill detector with LN2
- Cost efficiency - no LN2 required
- No need to wait for a 'warm' detector to cool. X-Max is stable for the most precise analysis within a few minutes
- Unique single sensor large area SDD
- 80mm² active area
- Throughput > 200,000 cps
- MnKa typically 125eV
- Be detection
- Vacuum enclosed sensor to reduce oxygen absorption
- Only one pulse processing channel required
- Optimised geometry for TEM
- Motorised slide as standard