X-Strata980 - For Analysis of Trace Elements and Coating Thickness

• Trace analysis of hazardous substances (RoHS/ELV/WEEE)
• Multi-layer coating thickness and/or composition analysis
• Alloy identification and chemistry analysis
• Plating solution analysis
• Gold karat assay

Oxford Instruments offers a full range of instruments dedicated to the electronics manufacturing industry. Our XRF instruments are available in different configurations for RoHS compliance screening and testing. When testing for the presence of lead, as with high-reliablity electronics, the X-Strata980 can assure quality.  Please contact us to find out about the wide variety of solutions offered.

• 100W X-ray tube and 25mm2 Peltier cooled PIN detector
• Multiple collimators
• Simultaneous analysis of thickness and composition
• Mapping software
• Combined calibration  method
• Color-coded pass/fail results
• Giant chamber
  

• X-ray excitation
• 100W (50kV and 2mA) micro-focus tungsten anode tube
• Detector
• 25mm2 PIN detector with Peltier cooling
• Filters/Collimators
• Up to 4 primary filters
• Up to 4 collimators (0.1, 0.2, 0.3, 1.27mm Ø)
• Digital Pulse Processing
• 4096 CH digital multi-channel analyzer
• Automatic signal processing including dead time correction and pulse pile up rejection
• Computer/Display/OS
• Celeron, 1.86 GHz,  40 GbHD, 512Mb RAM, equivalent or better
• 15”LCD, 1024 x 768
• MicrosoftTM XP SP2
• Power Supply
• 85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz
• Working Environment
• 50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
• XYZ Travel
• 203 x 152 x 216 mm (8 x 6 x 8.5”) fully programmable