One way to check for ice on your detector is to collect a spectrum
from a piece of Cr metal at 20kV, and look at the L lines around
0.5keV. The L line spectrum consists of the Ll line at 0.5keV, and
the La line at 0.571keV. The La line
is on the high-energy side of the oxygen absorption edge (energy
0.531keV) whilst the Ll line is on the low energy side. Therefore
CrLa X-rays are much more efficiently
absorbed by ice than CrLl X-rays. On a detector with little or no
ice on the crystal face the La line should
be higher than the Ll line (Fig.1). On a detector which has ice
built up on the crystal the Ll line will be higher (Fig. 2).
This
crystal contamination is an unavoidable consequence of the polymer
window used in today's detectors, with which all detector manufacturers
have to deal with. Significantly, Oxford Instruments is the only
EDS manufacturer that has a patented conditioner that allows this
crystal contamination to be removed without having to remove the
detector from the microscope (as you would with other systems).
This saves you valuable time and effort, keeps your detector in
optimum condition, and more importantly, ensures that your results
are consistent and accurate.
We recommend you check for ice build up using the test described
above. If this test reveals the presence of ice then you should
condition your detector.
Next
month's Tip will explain the simple steps you need to follow
to condition your detector.
If you would like to find out how to do this now, details are
available on our web site at:
http://x-raymicroanalysis.com/INCAtips
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Fig. 1. Detector with no ice on the crystal

Fig. 2. Detector with ice on the crystal
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